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Dynamic Burn-In, Life-Test ...For New Challenges
We Invent New Solutions... -
... «BiBurn» Solutions :
READ MOREPlaces driver in oven, nearest to component
Driver stays cool, component feels the heat
Reliable test data, closest to actual conditionsEasy to use, reconfigurable for
    different component developments
![](https://bibench.com/wp-content/uploads/2018/02/more.png)
BiBurn Highlights
- System usable at high or low temperature for high-end component functional tests.
- Nominal operation qualification under stress!
- True dynamic aging solution for DDRx, High Capicity Nand Flash, High Res Image Sensor, etc. Available now!
- Designed to be used in your existing oven thanks to the patented « air-cooled » system : no equipment change!
- Easy to use: "on-desk" comfortable component installation. Easy to handle system with in-oven latch and automatic connection.
- Reconfigurable, reusable for different component types and different developments.
![](https://bibench.com/wp-content/uploads/2018/02/more.png)
BiBurn Benefits
- Many of existing component tests activate only an extremely limited surface of the die (e.g. DDR-Sdram) and do not stress the sensitive parts of components (e.g. Flashs / floating gate).
- Some recent components, such as FPGA, SoC, etc … , may present fault trees whose intricacies follow their own complexity. Bibench solutions helps you address this issue by allowing test under real conditions.
- Nowadays the life expectancy for a commercial component (smart-phone, computer...) is less than 4 or 5 years against 10 years formerly. Using these components for reliable applications therefore requires deeper tests. Keep cool : our systems are there for that !
- Highly qualitative tests compared to static burn-in or pseudo-dynamic testing: brings more failure modes with more objective results for better Go/NoGo sorting.
- Optimized test time: for flawed components, no parametric test required… Independent test slots: partial batches possible, the stop of a faulty component has no influence on others…
- Defective components are instantly detected: replace and restart position with no dead time.
- Reliable system, recognized in the space field.
![](https://bibench.com/wp-content/uploads/2018/02/more.png)
R&D Services
![Zynq Ultrascale+ radiation test](https://bibench.com/wp-content/uploads/2019/11/1172_vue-gene-_3d_002.png)
- BiBench is also innovative in services with recognized expertise in the field of complex components / systems, mostly in the space domain...
- Emulation / ground development systems for Nanosat / Microsat.
- Reference design for SoC and FPGA based systems.
- Development of radiation test systems for complex components (SoC/FPGA, DDRx, Image Sensors ...).
- R & D on dedicated components testing systems.
![](https://bibench.com/wp-content/uploads/2018/02/more.png)
They already trust us…
![](https://bibench.com/wp-content/uploads/2018/02/more.png)
BiBench live !
![BiBench Hemeria OBC BalMan](https://bibench.com/wp-content/uploads/2024/04/BiBench-BalMan-web.jpg)
OBC BalMan
Bibench livre les
premiers OBC BalMan
à Héméria.
Le début d’une grande aventure !
![](https://bibench.com/wp-content/uploads/2023/03/Embauche-2023p.jpg)
BiBench recrute !
Un cadre de travail motivant, des sujets de haute technicité,
une organisation responsabilisante :
BiBench Systems cherche un(e) nouvel(le) électronicien(ne)
Welcome !
![](https://bibench.com/wp-content/uploads/2018/02/more.png)